成果简介
图文导读
图1. Schematic illustration of the fabricating procedure of PW/CPAN@CNT/GA.
图2. a) FTIR spectra of CNTs, PAN@CNT, CPAN@CNT, GO, rGA, PCGA and CPAN@CNT/GA. b, c) C 1s XPS spectra, d) Raman spectra, e) XRD patterns of GO, rGA, PCGA and CPAN@CNT/GA. f) TGA curves of CNTs, PAN@CNT, PAN, GO, rGA, PCGA and CPAN@CNT/GA.
图 3. a-h) SEM images of rGA, CPAN@CNT/GA-1, 2, 3, 4, 5, 6 and 7. i) SEM images of PCGA. j) SEM images of CPAN@CNT/GA. k) EDS mapping images of CPAN@CNT/GA. l-n) TEM images of CPAN@CNT/GA with various magnification.
图4. a) Compressive stress of rGA, CGA, PCGA, CPAN@CNT/GA, PGA and CPGA at 20% and 50% strain. b) Compressive stress of CPAN@CNT/GA with different PAN@CNT content. c) Stress-strain curves of CPAN@CNT/GA with 10 cycles. d) Comparison of compression results with other studies. e) Time-temperature curves of rGA and CPAN@CNT/GA heating on 100°C and 200°C hot plates. f) Thermal conductivity of rGA, PCGA, CPAN@CNT/GA, PW/CPAN@CNT/GA and PW. g) The schematic of the articular structure.
图5. a) FTIR spectra of PW and PW/CPAN@CNT/GA. b) Heating and c) cooling DSC curves of PW, CPAN@CNT/GA and PW/CPAN@CNT/GA. d) Enthalpy and phase change temperatures of PW and PW/CPAN@CNT/GA. e, f) FTIR spectra and DSC curves of PW/CPAN@CNT/GA for 100 cycles. g) Infrared images of PW/CPAN@CNT/GA on a 100 °C hot plate. h) Time-temperature curves of CPAN@CNT/GA, PW/CPAN@CNT/GA and DPGA on a 100 °C hot plate.
图6. a) Schematic diagram of PW/CPAN@CNT/GA in the field of solar-thermal energy conversion. b) Schematic diagram of simulated sunlight exposure. c) Ultraviolet-visible-near-infrared absorption spectra of PW and PW/CPAN@CNT/GA. d) Time-temperature curves of CPAN@CNT/GA, PW and PW/CPAN@CNT/GA under 1 kW m-2irradiation.
图7. a) Schematic drawing of STEG system. b) Output voltages of the blank, PW and PW/CPAN@CNT/GA-covered thermoelectrics when the heatsink is in the air. c) Output voltages and d) currents of PW/CPAN@CNT/GA-covered thermoelectrics when the heatsink is in the air. e) Steady output electricity of PW/CPAN@CNT/GA. f) STEG uses proof-of-concept experiments to sustain the operation of electronic devices. g) Digital pictures of power generation devices. h) Digital pictures of electrical devices at work.
小结
文献:
https://doi.org/10.1016/j.carbon.2025.120446
▓ 来源:材料分析与应用
▓ 责编:小棉袄